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Polycrystal orientation maps from TEM.

J-J Fundenberger¹, A Morawiec, E Bouzy

¹Laboratoire d'Etude des Textures et Application aux Materiaux (LETAM), Institut Superieur de Genie Mecanique et Productique, Universite de Metz, UMR CNRS 7078, Ile du Saulcy, Metz, France.

Ultramicroscopy

|April 4, 2003

Summary

This summary is machine-generated.

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Orientation precision of TEM-based orientation mapping techniques.

Ultramicroscopy·2013

A new transmission electron microscope (TEM) system creates detailed crystallite orientation maps for polycrystalline materials. This advanced technique offers superior accuracy and resolution for fine-scale material characterization.

Area of Science:

Materials Science
Crystallography
Electron Microscopy

Background:

Investigating polycrystalline materials relies on determining crystallite orientation topography.
Transmission Electron Microscopy (TEM) and Scanning Electron Microscopy (SEM) with Electron Backscatter Diffraction (EBSD) are key techniques.

Purpose of the Study:

To present a novel system for generating orientation maps using TEM.
To highlight the advantages of TEM-based orientation mapping over SEM/EBSD for fine-scale analysis.

Main Methods:

A computer-controlled TEM with a CCD camera was used for automated, step-by-step beam scanning.
Kikuchi and Convergent Beam Electron Diffraction patterns were acquired, indexed, and analyzed to determine crystallite orientations.
The system was tested on an aluminum sample subjected to severe plastic deformation.

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Main Results:

The TEM-based system achieved orientation determination accuracy better than 0.1 degrees.
A spatial resolution of approximately 10nm was attained, surpassing SEM/EBSD capabilities.
Example orientation maps of deformed aluminum revealed fine-scale microstructural details.

Conclusions:

The developed TEM orientation mapping system provides high accuracy and resolution for crystallographic analysis.
This technique is crucial for characterizing fine structure materials at scales inaccessible to SEM/EBSD.
Automatic orientation mapping complements conventional TEM imaging, offering valuable insights into material behavior.