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Defining the parameters of a cantilever tip AFM by reference structure
V A Bykov1, Yu A Novikov, A V Rakov
1Nanotechnology MDT, Zelenograd, Moscow, Russia.
Ultramicroscopy
|April 4, 2003
Abstract:
A method of measurement and control of atomic force microscope (AFM) probe parameters is offered. The AFM real cantilever parameters are defined.
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