Advances in EELS spectroscopy by using new detector and new specimen preparation technologies

C Scheu1, M Gao, K Van Benthem

  • 1Max-Planck-Institut für Metallforschung, Heisenbergstr. 3, Stuttgart 70569, Germany. scheu@hrem.mpi-stuttgart.mpg.de

Journal of Microscopy
|April 16, 2003
PubMed