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Related Experiment Videos

Wideband high-frequency line-focus PVDF transducer for materials characterization.

Wei Zou1, Steve Holland, Kwang Yul Kim

  • 1Department of Theoretical and Applied Mechanics, Cornell University, Ithaca, NY 14853, USA. zouwei@us.ibm.com

Ultrasonics
|May 3, 2003
PubMed
Summary

Researchers developed a wideband, high-frequency transducer using polyvinylidene fluoride (PVDF) film, achieving over 150 MHz for advanced material property analysis.

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Area of Science:

  • Materials Science
  • Acoustics
  • Piezoelectric Devices

Background:

  • Advanced materials characterization requires high-frequency acoustic transducers.
  • Polyvinylidene fluoride (PVDF) offers unique piezoelectric properties for transducer fabrication.

Purpose of the Study:

  • To design, fabricate, and characterize a wideband, high-frequency, line-focus beam transducer.
  • To demonstrate the transducer's application in measuring anisotropic elastic properties of silicon wafers.

Main Methods:

  • Utilized a 9 µm thick piezoelectric polyvinylidene fluoride (PVDF) film for transducer construction.
  • Measured frequency spectrum, focal length (2.38 mm), and aperture angle (84 degrees).
  • Operated the transducer in pulse and radio-frequency (rf) tone burst modes.

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Main Results:

  • Achieved a wide frequency response from 10 MHz to over 100 MHz, exceeding 150 MHz with compensation.
  • Successfully measured phase velocities of surface acoustic waves (SAW) on a silicon wafer.
  • Demonstrated the transducer's capability for determining anisotropic elastic properties.

Conclusions:

  • The PVDF transducer is effective for high-frequency acoustic measurements.
  • The device enables precise characterization of material elastic properties.
  • This technology advances non-destructive material analysis techniques.