Calibration of AFM cantilever spring constants
Related Experiment Video
Updated: Sep 25, 2026

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid
Published on: December 2, 2022
Christopher T Gibson1, Brandon L Weeks, Chris Abell
1Department of Chemistry, Cambridge University, Lensfield Road, Cambridge CB2 1EW, UK. ctg22@cam.ac.uk
Abstract:
In this paper we present two simple, reliable and readily applicable methods for calibrating cantilevers and measuring the thickness of thin gold films. The spring constant calibration requires knowledge of the Young's modulus, density of the cantilever and resonant frequency. The thickness of thin gold layers was determined by measuring changes in the resonant frequency and Q-factor of beam shaped AFM cantilevers before and after coating. The techniques for measuring the spring constant and thin film thickness provide accuracy on the order of 10-15%.
Related Concept Videos
Euler's Formula to Columns: Problem Solving
The system comprises two vertical rigid bars, AB and BC, of...
Atomic Force Microscopy
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

