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Related Experiment Videos

Compositional averaging of backscatter intensities in compounds.

John J Donovan1, Nicholas E Pingitore, Andrew Westphal

  • 1Department of Geological Sciences, The University of Oregon, Eugene, Oregon 97403-1272, USA. donavan@oregon.uoregon.edu

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|June 17, 2003
PubMed
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Electron backscattering in electron microprobe analysis is not influenced by elemental mass. A new model based on electron fraction, not mass fraction, improves backscatter yield predictions and analytical accuracy.

Area of Science:

  • Geochemistry
  • Materials Science
  • Analytical Chemistry

Background:

  • Traditional electron microprobe analysis (EMPA) uses elemental mass fractions to predict backscattered electron (BSE) intensities.
  • This pragmatic approach assumes mass influences BSE yield, a concept lacking a strong physical basis.

Purpose of the Study:

  • To investigate the influence of elemental mass on electron backscattering using high-precision isotope measurements.
  • To develop and validate a more physically accurate model for predicting BSE yield in EMPA.

Main Methods:

  • High-precision measurements of stable isotope pairs of pure elements.
  • Comparison of experimental BSE yields with predictions from mass fraction and electron fraction models.
  • Development of an improved ZAF correction factor based on electron fraction.

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Main Results:

  • Isotopic measurements demonstrate that elemental mass has no significant effect on electron backscattering at typical microprobe energies.
  • The traditional mass fraction averaging model for BSE intensity lacks physical justification.
  • An alternative model based on electron fraction (number of electrons or protons) provides superior prediction of backscatter yield.
  • An improved backscatter factor using a modified electron fraction average enhances ZAF corrections, particularly for large atomic number effects.

Conclusions:

  • Elemental mass is not a determinant of electron backscattering in EMPA.
  • The electron fraction model offers a more accurate and physically grounded approach to predicting BSE yield.
  • The refined ZAF correction factor improves analytical precision in electron microprobe analysis, especially in complex materials.