Two-dimensional visible synchrotron light interferometry for transverse beam-profile measurement at the SPring-8...

Area of Science:

• Physics
• Accelerator Science
• Optical Metrology

Background:

• Electron beam diagnostics are crucial for accelerator performance.
• Existing methods may lack simultaneous 2D profile measurement capabilities.
• Synchrotron light offers a powerful probe for beam characterization.

Purpose of the Study:

• To develop and validate a two-dimensional visible synchrotron light interferometer.
• To enable simultaneous measurement of electron beam transverse profiles, including sizes and tilt angles.
• To investigate electron beam behavior at the SPring-8 storage ring.

Main Methods:

• Development of a visible synchrotron light interferometer.
• Application of basic formulae to explain the interferometer's principle.
• Calibration of the point-spread function using an error model for optical disturbances.
• Experimental observation of an electron beam at the SPring-8 storage ring under various working conditions.

Main Results:

• Simultaneous measurement of major and minor axis beam sizes and beam-tilt angle achieved.
• Observed significant beam broadening (20 to 120 micrometers) in the vertical direction near differential resonance.
• Detected changes in the beam-tilt angle correlated with working points.
• Identified limitations in vertical spatial resolution due to aperture constraints.

Conclusions:

• The developed two-dimensional interferometer is effective for measuring electron beam transverse profiles.
• The instrument successfully revealed beam dynamics, such as broadening and tilt angle variations.
• Further improvements are needed to overcome resolution limitations for enhanced diagnostic capabilities.