Related Experiment Video

Updated: Aug 17, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

Imaging individual atoms inside crystals with ADF-STEM

P M Voyles1, J L Grazul, D A Muller

  • 1Bell Laboratories, Lucent Technologies, 700 Mountain Ave, Rm 1D-437, Murray Hill, NJ 07974-0636, USA. voyles@engr.wisc.edu

Ultramicroscopy
|July 23, 2003
PubMed

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