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Related Experiment Videos

Artifacts in aberration-corrected ADF-STEM imaging.

Zhiheng Yu1, Philip E Batson, John Silcox

  • 1Physics Department, Cornell University, 117 Clark Hall, Ithaca, NY 14850, USA.

Ultramicroscopy
|July 23, 2003
PubMed
Summary
This summary is machine-generated.

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An experimental black level in annular dark field scanning transmission electron microscopy (ADF-STEM) can create artifacts in high-resolution images. Simulations show these artifacts appear in power spectra, especially with smaller probes, impacting resolution interpretation.

Area of Science:

  • Materials Science
  • Electron Microscopy
  • Solid-State Physics

Background:

  • High-resolution imaging in electron microscopy is crucial for materials characterization.
  • Annular dark field scanning transmission electron microscopy (ADF-STEM) offers high contrast and Z-sensitivity.
  • Artifacts in ADF-STEM images can lead to misinterpretation of material structures.

Purpose of the Study:

  • To investigate the impact of experimental black level settings on high-resolution ADF-STEM imaging.
  • To simulate and analyze artifactual details introduced by artificial black levels.
  • To provide guidance on interpreting ADF-STEM images, particularly concerning resolution limits.

Main Methods:

  • Multislice simulations were performed for scanning transmission electron microscopy (STEM).

Related Experiment Videos

  • Simulations utilized three different STEM probe sizes (0.8, 1.2, and 2.0 Å).
  • A <1;10> oriented Si/Ge crystal was used as the sample material.

    • Main Results:

    • High-frequency artifact peaks were observed in power spectra when an artificial black level clipped the background signal.
    • The magnitude of the lowest signal in ADF-STEM images decreased with smaller incident probe sizes.
    • Simulated results showed good agreement with an experimental ADF-STEM image.

    Conclusions:

    • Artificial black levels in ADF-STEM can introduce significant artifactual details into lattice images.
    • Interpreting microscope resolution limits requires careful consideration of nonzero black level settings, especially for sub-Ångström probes.
    • Aberration-corrected STEM instruments demonstrate sensitivity to low-level signal details, necessitating precise black level calibration.