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Guided progressive reconstructive imaging: A new quantization-based framework for low-dose, high-throughput and

Hoelen L Lalandec Robert¹, Arno Annys¹, Tamazouzt Chennit¹

¹Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium; NANOlight Center of Excellence, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.

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Summary

This summary is machine-generated.

A new guided progressive reconstructive imaging workflow leverages fast detectors for rapid phase retrieval. This method offers high dose-efficiency and flexibility for various imaging techniques.

Keywords:

Event-driven detection Low-dose imaging Ptychography Wigner distribution deconvolution

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Area of Science:

Imaging Science
Computational Imaging
Phase Retrieval

Background:

Recent advancements in detector technology enable high time resolutions (few nanoseconds).
Existing direct phase retrieval methods often require dense data representations and have field-of-view limitations.

Purpose of the Study:

To establish a novel ptychographic workflow for advanced imaging.
To adapt direct phase retrieval solutions for continuous data treatment and faster processing.

Main Methods:

Development of guided progressive reconstructive imaging (GPRI).
Quantization-based description of acquired intensity.
Adaptation of Wigner distribution deconvolution for continuous count treatment.
Utilizing a pre-calculated library of kernel-limited functions for accelerated processing.

Main Results:

Achieved processing speeds surpassing acquisition bandwidth, enabling real-time feedback.
Progressively improving image estimates with high dose-efficiency.
Reduced restrictions on the field of view compared to existing methods.
Demonstrated straightforward and flexible implementation.

Conclusions:

The new GPRI workflow represents a significant advancement in ptychographic imaging.
Facilitates repeatable, low-dose experiments with enhanced accessibility.
Applicable to diverse fields including electron microscopy, X-ray diffraction, and optical microscopy.