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Updated: Jun 29, 2026

Test Samples for Optimizing STORM Super-Resolution Microscopy
Published on: September 6, 2013
Arno Annys1, Hoelen L Lalandec Robert1, Saleh Gholam1
1Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium; NANOlight Center of Excellence, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.
Event-driven detectors in scanning transmission electron microscopy (STEM) offer efficient data handling. Optimizing the entire pipeline for this event format minimizes data size and computational needs for advanced microscopy.
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