Structural effects of Ti underlayer on CoCrPt magnetic films

Area of Science:

• Materials Science
• Condensed Matter Physics
• Thin Film Technology

Background:

• The magnetic properties of thin films are crucial for data storage and spintronic devices.
• Controlling the microstructure and texture of magnetic layers is essential for optimizing performance.
• Underlayers play a significant role in influencing the growth and properties of overlying magnetic films.

Purpose of the Study:

• To investigate the influence of titanium (Ti) underlayer thickness on the magnetic properties of sputtered Cobalt-Chromium-Platinum (Co72Cr21Pt7) films.
• To understand the relationship between the structural order of the Ti underlayer and the resulting magnetic texture and properties.
• To correlate structural findings with magnetic measurements and surface analysis.

Main Methods:

• Synchrotron X-ray scattering (XRD) was employed to analyze the long-range and short-range order of Ti underlayers.
• X-ray absorption near-edge structure (XANES) spectroscopy provided insights into the electronic structure and chemical states.
• Magnetic measurements and X-ray photoelectron spectroscopy (XPS) were used for complementary analysis.

Main Results:

• Thin Ti underlayers (10 nm) exhibited oxidation and intermixing, hindering texture development in the magnetic Co72Cr21Pt7 films.
• This lack of texture in thin underlayers led to poor magnetic properties.
• Thicker Ti underlayers (e.g., >10 nm) showed increased crystallinity and enhanced texture.
• Improved Ti underlayer crystallinity promoted better magnetic peak alignment and superior magnetic properties.

Conclusions:

• Titanium underlayer thickness is a critical parameter for controlling the magnetic properties of Co72Cr21Pt7 films.
• Optimizing Ti underlayer crystallinity and minimizing oxidation/intermixing are key to achieving desirable magnetic performance.
• The study highlights the importance of underlayer engineering in the development of advanced magnetic materials.