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Updated: Aug 5, 2026

Lensfree On-chip Tomographic Microscopy Employing Multi-angle Illumination and Pixel Super-resolution
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Published on: August 16, 2012

Cross-correlation tomography: measuring dark energy evolution with weak lensing

Bhuvnesh Jain1, Andy Taylor

  • 1Department of Physics and Astronomy, University of Pennsylvania, Philadelphia, Pennsylvania 19104, USA.

Physical Review Letters
|November 13, 2003
PubMed

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