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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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Bias-dependent visualization of electron donor (D) and electron acceptor (A) moieties in a chiral DAD triad molecule

Atsushi Miura1, Zhijian Chen, Hiroshi Uji-I

  • 1Katholieke Universiteit Leuven, Department of Chemistry, Celestijnenlaan 200 F, B-3001 Leuven, Belgium.

Journal of the American Chemical Society
|December 5, 2003
PubMed

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