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Updated: Aug 29, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Development in situ for gratings recorded in photoresist
Juan Antonio Rayas1, Amalia Martínez, Ramón Rodríguez-Vera
1Centro de Investigaciones en Optica, Asociación Civil, Apartado Postal 1-948, C. P. 37000, Le6n, Gto., Mexico. jrayas@cio.mx
Abstract:
A technique for developing recording gratings in situ in Photoresist Shipley S-1822 is described. The developing process is accomplished by use of a spray without removing the sample from the optical setup. The results for the diffraction efficiency show that there is not a large difference between gratings achieved with the traditional wet development process and those obtained with the in situ developing technique. The potential of this in situ developing technique is shown with a moiré interferometric experimental setup used for displacement showing.

