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Updated: Aug 29, 2026

Characterizing Far-infrared Laser Emissions and the Measurement of Their Frequencies
Published on: December 18, 2015
Absolute frequency measurement of an acetylene-stabilized laser at 1542 nm
Feng-Lei Hong1, Atsushi Onae, Jie Jiang
1National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan. f.hong@aist.go.jp
Abstract:
The absolute frequency of an acetylene-stabilized laser at 1542 nm is measured at its second harmonic (771 nm) by use of a femtosecond optical comb based on a mode-locked Ti:sapphire laser. Frequency stability and reproducibility of the acetylene-stabilized laser are evaluated by the femtosecond comb with a H maser as a frequency reference. The absolute frequency of a laser diode stabilized on the P(16) transition of 13C2H2 is determined to be 194 369 569 383.6(1.3) kHz. The acetylene-stabilized laser serves as an important optical frequency standard for telecommunication applications.
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