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Photoelastic effect from die bonding of diode lasers
Mark A Fritz1, Daniel T Cassidy
1Department of Engineering Physics, McMaster University, 1280 Main Street West, JHE A301, Hamilton, Ontario L8S 4L7, Canada. fritzma@mcmaster.ca
Applied Optics
|January 13, 2004
Abstract:
The effect of strain induced from die bonding on the optical guiding of a ridge-waveguide laser is examined. Measurements of the strain in a p-down-mounted InP-based diode laser with fits to polarization-resolved photoluminescence are used to compute the resulting photoelastic effect in a ridge waveguide. The strain is found to alter the refractive indices in the material sufficiently in the waveguide to change the mode and reduce the optical confinement. In the far field the beam is calculated to be made narrow and asymmetric by the die-bonding strain.