Patch Clamp
Atomic Force Microscopy
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Updated: Jul 13, 2026

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
Published on: October 24, 2014
S Besch1, K V Snyder, P C Zhang
1Huges Center for Single Molecule Biophysics, Physiology and Biophysical Sciences, SUNY at Buffalo, Buffalo, NY 14214, USA.
A modified atomic force microscope (AFM) enables reliable patch-clamp measurements for biological studies. This enhanced AFM system achieves high sensitivity, allowing detailed analysis of cellular responses.
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