Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Videos

Progressive steps in the development of electron backscatter diffraction and orientation imaging microscopy.

D Dingley1

  • 1TSL_EDAX, Draper, Utah 84020, USA. david.dingley@ametek.com

Journal of Microscopy
|March 11, 2004
PubMed
Summary

Electron Backscatter Diffraction (EBSD) has advanced significantly in camera technology and software over the past decade. These improvements enhance phase identification, spatial resolution below 10 nm, and lattice spacing measurements for materials research.

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Microstructural and microtextural characterization of oxide scale on steel using electron backscatter diffraction.

Journal of microscopy·2004
Same author

Safe water practices can lower risk of contracting primary amoebic meningoencephalitis.

Texas medicine·1996
Same author

Cryptosporidiosis outbreak in a day-care center.

American journal of diseases of children (1960)·1985
Same author

Macracanthorhynchus ingens from a child in Texas.

The American journal of tropical medicine and hygiene·1985

Area of Science:

  • Materials Science
  • Crystallography
  • Analytical Techniques

Background:

  • Electron Backscatter Diffraction (EBSD) technology has become more accessible to materials researchers over the last ten years.
  • Significant advancements in camera technology and software have occurred during this period.

Purpose of the Study:

  • To review key developments in EBSD camera technology and software.
  • To assess the impact of these advancements on materials characterization.
  • To highlight current capabilities and limitations of EBSD.

Main Methods:

  • Review of slow-scan charge-coupled device (CCD) camera applications in EBSD.
  • Analysis of spatial resolution limits.
  • Development and application of improved lattice spacing measurement procedures.

Related Experiment Videos

  • Investigation of phase identification in complex materials.
  • Simultaneous collection and off-line analysis of chemical and EBSD data.

    • Main Results:

    • Current spatial resolution of EBSD is below 10 nm.
    • Improved lattice spacing measurements show relative errors of ±3% for silicon and nickel.
    • Recrystallized fraction in aluminum can be confidently extracted, but substructure mapping in deformed regions is challenging.
    • EBSD phase identification is improved for complex cases, especially when combined with chemical data and off-line analysis.

    Conclusions:

    • Recent advancements in EBSD technology have enhanced its capabilities for materials analysis.
    • The technique offers high spatial resolution and accurate lattice spacing measurements.
    • Combined chemical and EBSD data analysis improves phase identification in complex materials.