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Characterization of Ultra-fine Grained and Nanocrystalline Materials Using Transmission Kikuchi Diffraction
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Reconstruction of grains and subgrains from electron backscatter diffraction maps.

F J Humphreys1

  • 1Manchester Materials Science Centre, University of Manchester and UMIST, Grosvenor Street, Manchester Ml 7HS, UK. john.humphreys@umist.ac.uk

Journal of Microscopy
|March 11, 2004
PubMed
Summary

Reconstructing grains from electron backscatter diffraction (EBSD) maps significantly enhances microstructural data. This method reveals detailed grain boundary and triple junction information crucial for understanding material behavior.

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Area of Science:

  • Materials Science
  • Crystallography
  • Metallurgy

Background:

  • Electron backscatter diffraction (EBSD) provides valuable microstructural data on grains and boundaries.
  • Current EBSD analysis can be limited in its ability to fully characterize complex microstructures.

Purpose of the Study:

  • To explore methods for reconstructing complete grains and subgrains from EBSD data.
  • To demonstrate how grain reconstruction enhances quantitative microstructural analysis.
  • To highlight the utility of reconstructed data for understanding boundary properties and triple junctions.

Main Methods:

  • Pixel re-analysis of EBSD maps to reconstruct individual grains and subgrains.
  • Correlation of dimensional, positional, orientational, and misorientational parameters.
  • Automated analysis routines for triple junction and boundary network characterization.

Main Results:

  • Grain reconstruction significantly increases the quantity and quality of microstructural data.
  • Detailed information on grain dimensions, positions, orientations, and misorientations is obtained.
  • Nature, location, and contacts of all triple junctions are revealed.
  • Boundary connectivity, path lengths, and directions for potential failure events are determined.
  • Alignment of boundaries relative to crystallography and deformation geometry is quantified.

Conclusions:

  • Grain reconstruction from EBSD data is a powerful technique for advanced microstructural analysis.
  • This approach provides unique insights into grain boundary behavior and material failure mechanisms.
  • Automated analysis of reconstructed microstructures enables deeper understanding of material properties.