Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

F J Humphreys

Showing results (1-10 of 11) with videos related to

Pageof 2
Sort By:
Journal of Microscopy|March 11, 2004
Reconstruction of grains and subgrains from electron backscatter diffraction mapsF J Humphreys
Journal of Microscopy|August 12, 1999
High resolution electron backscatter diffraction with a field emission gun scanning electron microscopeF J Humphreys, I Brough
Journal of Microscopy|March 11, 2004
Quantifying recrystallization by electron backscatter diffractionH Jazaeri, F J Humphreys
Journal of Microscopy|March 11, 2004
A study of recrystallization in single-phase aluminium using in-situ annealing in the scanning electron microscopeP J Hurley, F J Humphreys
Journal of Microscopy|May 9, 2002
Characterizing the deformed state in Al-0.1 Mg alloy using high-resolution electron backscattered diffractionP J Hurley, F J Humphreys
Journal of Microscopy|October 9, 2002
The application of a hot deformation SEM stage, backscattered electron imaging and EBSD to the study of thermomechanical processingY Huang, F J Humphreys, I Brough
Journal of Microscopy|May 28, 2008
Recrystallization phenomena in an IF steel observed by in situ EBSD experimentsH Nakamichi, F J Humphreys, I Brough
Journal of Microscopy|May 28, 2008
The influence of low-strain thermo-mechanical processing on grain boundary network characteristics in type 304 austenitic stainless steelD L Engelberg, F J Humphreys, T J Marrow
Journal of Microscopy|January 3, 2001
Orientation averaging of electron backscattered diffraction dataF J Humphreys, P S Bate, P J Hurley
Journal of Microscopy|November 5, 2005
The characterization of low-angle boundaries by EBSDP S Bate, R D Knutsen, I Brough, et al.
Pageof 2

Showing results (1-10 of 11) with videos related to

Sort By:
Pageof 2
Journal of Microscopy|March 11, 2004
Reconstruction of grains and subgrains from electron backscatter diffraction mapsF J Humphreys
Journal of Microscopy|August 12, 1999
High resolution electron backscatter diffraction with a field emission gun scanning electron microscopeF J Humphreys, I Brough
Journal of Microscopy|March 11, 2004
Quantifying recrystallization by electron backscatter diffractionH Jazaeri, F J Humphreys
Journal of Microscopy|March 11, 2004
A study of recrystallization in single-phase aluminium using in-situ annealing in the scanning electron microscopeP J Hurley, F J Humphreys
Journal of Microscopy|May 9, 2002
Characterizing the deformed state in Al-0.1 Mg alloy using high-resolution electron backscattered diffractionP J Hurley, F J Humphreys
Journal of Microscopy|October 9, 2002
The application of a hot deformation SEM stage, backscattered electron imaging and EBSD to the study of thermomechanical processingY Huang, F J Humphreys, I Brough
Journal of Microscopy|May 28, 2008
Recrystallization phenomena in an IF steel observed by in situ EBSD experimentsH Nakamichi, F J Humphreys, I Brough
Journal of Microscopy|May 28, 2008
The influence of low-strain thermo-mechanical processing on grain boundary network characteristics in type 304 austenitic stainless steelD L Engelberg, F J Humphreys, T J Marrow
Journal of Microscopy|January 3, 2001
Orientation averaging of electron backscattered diffraction dataF J Humphreys, P S Bate, P J Hurley
Journal of Microscopy|November 5, 2005
The characterization of low-angle boundaries by EBSDP S Bate, R D Knutsen, I Brough, et al.
Pageof 2