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Detection and measurement of waviness on thin metallic wires
Cesar Tejeda1, Luis Miguel Sanchez-Brea, Eusebio Bernabeu
1Departamento de Optica, Universidad Complutense de Madrid, Facultad de Ciencias Fisicas, Ciudad Universitaria s/n 28040, Madrid, Spain.
Applied Optics
|March 16, 2004
Abstract:
We propose a model for determining the far-field diffraction pattern of wires with waviness. Analytical solutions are obtained by means of the stationary phase method, which allows us to determine dimensional parameters such as wire diameter and waviness factor. Experimental results are presented, which are in accordance with our theoretical description.
