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Related Experiment Videos

Effects of phase change on reflection in phase-measuring interference microscopy.

Arnaud Dubois1

  • 1Laboratoire d'Optique Physique, Ecole Supérieure de Physique et Chimie Industrielles, Centre National de la Recherche Scientifique, Unité Propre de Recherche A0005, 10 rue Vauquelin, F-75231 Paris Cedex 5, France. dubois@optique.espci.fr

Applied Optics
|March 16, 2004
PubMed
Summary

The phase change on reflection in interference microscopy is largely unaffected by objective numerical aperture. However, the resulting interferogram shift increases with numerical aperture, as confirmed by Linnik microscope measurements.

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Area of Science:

  • Optical microscopy
  • Interference microscopy
  • Phase contrast imaging

Background:

  • Phase changes upon reflection are critical in interference microscopy.
  • The numerical aperture (NA) of objectives can influence optical measurements.
  • Understanding NA effects is crucial for accurate interferogram analysis.

Purpose of the Study:

  • To investigate the dependence of phase change on reflection on objective numerical aperture (NA) in interference microscopy.
  • To quantify the shift in microscope interferogram response caused by phase changes on reflection as a function of NA.
  • To compare experimental measurements with theoretical predictions.

Main Methods:

  • Analytical calculations of phase change on reflection.
  • Numerical simulations to model interferogram response.

Related Experiment Videos

  • Experimental measurements using a Linnik interference microscope with objectives of varying NAs.

    • Main Results:

    • Phase change on reflection shows minimal dependence on objective NA.
    • Interferogram shift increases with increasing NA.
    • Experimental results align well with theoretical calculations.

    Conclusions:

    • The NA of the objective has a negligible impact on the phase change itself during reflection.
    • The observed interferogram shift is a significant consequence of the phase change and is directly related to NA.
    • The Linnik microscope is a suitable instrument for validating these findings in interference microscopy.