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Updated: Aug 25, 2026

Cryo-EM and Single-Particle Analysis with Scipion
Published on: May 29, 2021
Detecting particles in cryo-EM micrographs using learned features
Satya P Mallick1, Yuanxin Zhu, David Kriegman
1Department of Electrical and Computer Engineering, University of California at San Diego, La Jolla, CA 92093, USA. spmallick@graphics.ucsd.edu
Abstract:
A new learning-based approach is presented for particle detection in cryo-electron micrographs using the Adaboost learning algorithm. The approach builds directly on the successful detectors developed for the domain of face detection. It is a discriminative algorithm which learns important features of the particle's appearance using a set of training examples of the particles and a set of images that do not contain particles. The algorithm is fast (10 s on a 1.3 GHz Pentium M processor), is generic, and is not limited to any particular shape or size of the particle to be detected. The method has been evaluated on a publicly available dataset of 82 cryoEM images of keyhole lympet hemocyanin (KLH). From 998 automatically extracted particle images, the 3-D structure of KLH has been reconstructed at a resolution of 23.2 A which is the same resolution as obtained using particles manually selected by a trained user.

