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Optical-gradient antireflective coatings for 157-nm optical lithography applications
Hsuen-Li Chen1, Wonder Fan, Tzyy-Jyann Wang
1Department of Material Science and Engineering, National Taiwan University, Taipei, Taiwan. hlchen@ndl.gov.tw
Applied Optics
|April 13, 2004
Summary
Researchers developed an optical-gradient bottom antireflective coating (BARC) using oxygen plasma treatment of silicon nitride. This easily prepared BARC film achieves low reflectance for advanced lithography applications.
Area of Science:
- Materials Science
- Optical Engineering
- Semiconductor Manufacturing
Background:
- Advanced lithography requires precise control over light reflection to achieve smaller feature sizes.
- Traditional bottom antireflective coatings (BARCs) face challenges in meeting the stringent requirements of sub-70-nm lithography.
- Minimizing substrate reflectance is crucial for improving lithographic performance and process latitude.
Purpose of the Study:
- To develop a novel optical-gradient bottom antireflective coating (BARC) film.
- To investigate a simple and effective method for preparing the optical-gradient BARC.
- To evaluate the performance and suitability of the developed BARC for sub-70-nm lithography.
Main Methods:
- Preparation of silicon nitride films treated with oxygen plasma to create an optical gradient.
- Gradual variation of oxygen composition and optical constants within the silicon nitride film.
- Characterization of reflectance, thickness tolerance, and thermal stability of the optical-gradient BARC.
Main Results:
- Achieved reflectance below 1% on various highly reflective substrates.
- Demonstrated high thickness-controlled tolerance for the optical-gradient film.
- Confirmed high thermal stability during postexposure bake procedures.
Conclusions:
- The optical-gradient BARC film is easily prepared via oxygen plasma treatment of silicon nitride.
- The developed BARC exhibits excellent optical properties and thermal stability.
- This optical-gradient BARC is suitable for ArF and F2 excimer laser lithography in sub-70-nm applications.