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Updated: Aug 24, 2026

Writing and Low-Temperature Characterization of Oxide Nanostructures
Published on: July 18, 2014
Room temperature hydrogen gas sensitivity of nanocrystalline pure tin oxide
1Advanced Materials Processing and Analysis Center (AMPAC), Mechanical Materials Aerospace Engineering Department (MMAE), University of Central Florida, Orlando, Florida 32816, USA.
Abstract:
Nanocrystalline (6-8 nm) tin oxide (SnO2) thin film (100-150 nm) sensor is synthesized via sol-gel dip-coating process. The thin film is characterized using focused ion-beam microscopy (FIB) and high-resolution transmission electron microscopy (HRTEM) techniques to determine the film thickness and the nanocrystallite size. The utilization of nanocrystalline pure-SnO2 thin film to sense a typical reducing gas such as hydrogen, at room temperature, is demonstrated in this investigation. The grain growth behavior of nanocrystalline pure-SnO2 is analyzed, which shows very low activation energy (9 kJ/mol) for the grain growth within the nanocrystallite size range of 3-20 nm. This low activation energy value is correlated, via excess oxygen-ion vacancy concentration, with the room temperature hydrogen gas sensitivity of the nanocrystalline pure-SnO2 thin film sensor.

