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Experimental techniques using optically enabled ring oscillators.

Joshua D Schwartz1, Michael B Venditti, David V Plant

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Summary
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We developed a novel, noninvasive method to test optical transceiver performance in data links. This technique measures latency sensitivity to variables like temperature and power, aiding in reliable optical chip characterization.

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Area of Science:

  • Optoelectronics
  • Integrated Photonics
  • Data Communication

Background:

  • Characterizing transceiver performance is crucial for high-speed data links.
  • Existing methods may be invasive or dependent on specific hardware configurations.
  • Optical interconnects are vital for modern computing and communication systems.

Purpose of the Study:

  • To introduce a noninvasive technique for characterizing transceiver performance in parallel optical data links.
  • To enable measurement of transceiver latency sensitivity to key operational variables.
  • To provide a versatile method applicable across different packaging and circuit designs.

Main Methods:

  • Establishing a bidirectional optical link between two optically enabled chips to create a ring oscillator.
  • Utilizing the ring oscillator configuration to measure transceiver latency.
  • Systematically varying controlled parameters including temperature, optical output power, supply voltage, and device misalignment.

Main Results:

  • The proposed method successfully characterizes transceiver performance.
  • Experimental results demonstrate the sensitivity of latency to controlled variables.
  • The technique was validated through comparison with simulation data.

Conclusions:

  • The developed ring oscillator method offers a noninvasive and versatile approach for transceiver performance characterization.
  • This technique is independent of packaging, circuit topology, and optical medium, enhancing its applicability.
  • The findings contribute to improved reliability and understanding of optical data link components.