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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
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Off-axis electron holography of electrostatic potentials in unbiased and reverse biased focused ion beam milled

A C Twitchett1, R E Dunin-Borkowski, R J Hallifax

  • 1Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, UK.

Journal of Microscopy
|May 26, 2004
PubMed

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