Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Videos

Scattering-type near-field optical microscopy.

Fritz Keilmann1

  • 1Max-Planck-Institut für Biochemie, D-82152 Martinsried (München), Germany. keilmann@biochem.mpg.de

Journal of Electron Microscopy
|June 8, 2004
PubMed
Summary
This summary is machine-generated.

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Nanoscale Mechanical Manipulation of Ultrathin SiN Membranes Enabling Infrared Near-Field Microscopy of Liquid-Immersed samples.

Small (Weinheim an der Bergstrasse, Germany)·2024
Same author

Revealing Mode Formation in Quasi-Bound States in the Continuum Metasurfaces via Near-Field Optical Microscopy.

Advanced materials (Deerfield Beach, Fla.)·2024
Same author

Probing the micro- and nanoscopic properties of dental materials using infrared spectroscopy: A proof-of-principle study.

Acta biomaterialia·2023
Same author

Infrared-spectroscopic, dynamic near-field microscopy of living cells and nanoparticles in water.

Scientific reports·2021
Same author

Conformation in Ultrathin Polymer Brush Coatings Resolved by Infrared Nanoscopy.

Analytical chemistry·2020
Same author

Phase-resolved terahertz self-detection near-field microscopy.

Optics express·2018

This study introduces a novel nanoscale material characterization tool. It combines atomic force microscopy with optical/infrared light scattering for high-resolution surface mapping.

Area of Science:

  • Materials Science
  • Nanotechnology
  • Surface Science

Background:

  • Atomic Force Microscopy (AFM) is a standard technique for surface topography.
  • Characterizing nanoscale optical/infrared properties often requires separate techniques.
  • Integrating multiple characterization methods can enhance material analysis.

Purpose of the Study:

  • To develop and demonstrate a combined AFM and optical/infrared light scattering technique.
  • To enable simultaneous mapping of surface topography and optical/infrared properties.
  • To achieve high spatial resolution in nanoscale material characterization.

Main Methods:

  • Utilizing a novel tool that integrates AFM with local optical/infrared light scattering.
  • Performing simultaneous imaging of sample surface topography and optical/infrared response.

Related Experiment Videos

  • Achieving spatial resolution below 20 nm.

    • Main Results:

    • Demonstrated simultaneous mapping of topography and optical/infrared properties.
    • Achieved spatial resolution better than 20 nm for both types of data.
    • Validated the effectiveness of the combined technique for nanoscale material analysis.

    Conclusions:

    • The integrated AFM and light scattering tool is highly promising for nanoscale material characterization.
    • Simultaneous measurement provides a more comprehensive understanding of material surfaces.
    • The technique offers significant advantages in spatial resolution and data acquisition.