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Updated: Aug 23, 2026

Fabrication and Characterization of Superconducting Resonators
Published on: May 21, 2016
An apparatus for temperature-dependent soft X-ray resonant magnetic scattering
Nicolas Jaouen1, Jean Marc Tonnerre, Grigor Kapoujian
1Laboratoire de Cristallographie, CNRS, BP 16, 25 Avenue des Martyrs, 38042 Grenoble, France. jaouen@esrf.fr
Abstract:
Interest in the use of soft X-ray resonant magnetic scattering techniques to probe the distribution of magnetic moments in thin films has exploded during the last few years. In this paper a novel diffractometer devoted to temperature-dependent soft X-ray resonant scattering is described. The principal features of the diffractometer are presented and illustrated through experiments performed at LURE during the commissioning phase.
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