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Published on: January 3, 2016
Near-field magneto-optical analysis in reflection mode SNOM
Satoshi Takahashi1, Wayne Dickson, Robert Pollard
1School of Mathematics and Physics, The Queen's University of Belfast, Belfast BT7 1NN, UK. s.takahashi@qub.ac.uk
Ultramicroscopy
|July 3, 2004
Summary
Scanning near-field optical microscopy (SNOM) visualizes magnetic domains in Co and Ni films using magneto-optical Kerr effects. Topography can influence contrast in nickel films, complicating domain analysis.
Area of Science:
- Materials Science
- Optics
- Magnetism
Background:
- Magnetic domain observation is crucial for understanding magnetic materials.
- Scanning Near-field Optical Microscopy (SNOM) offers high-resolution imaging capabilities.
- Magneto-optical Kerr effects provide contrast based on magnetization.
Purpose of the Study:
- To demonstrate SNOM for observing in-plane magnetic domains.
- To investigate the influence of polarization on magneto-optical contrast.
- To analyze domain orientation in Cobalt (Co) and Nickel (Ni) thin films.
Main Methods:
- Utilized SNOM in reflection mode.
- Employed longitudinal and transverse magneto-optical Kerr effects.
- Analyzed changes in reflected light polarization and reflectance.
Main Results:
- SNOM images revealed magneto-optical contrast in Co and Ni films.
- Domain orientation was estimated for smooth Co films.
- Topographic features in Ni films introduced complex polarization dependencies and cross-talk.
Conclusions:
- SNOM is effective for visualizing magnetic domains.
- Polarization control is key for accurate contrast interpretation.
- Surface topography can significantly impact SNOM magneto-optical contrast, especially in Ni films.
