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Updated: Aug 23, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

XAFS studies of interfaces in MnSe/ZnTe superlattices

A J Kropf, B A Bunker, J K Furdyna

    Journal of Synchrotron Radiation
    |July 21, 2004
    PubMed
    Abstract

    No abstract available in PubMed .

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