Dead-time correction of a multi-element SSD for fluorescent XAFS

Area of Science:

• Physics
• Materials Science
• Analytical Chemistry

Background:

• Accurate quantification in X-ray absorption fine structure (XAFS) experiments relies on precise detector performance.
• Multi-element detector systems are susceptible to counting losses that can affect data integrity.

Purpose of the Study:

• To investigate and implement effective methods for evaluating and correcting the live time of a multi-element detection system for fluorescent XAFS.
• To ensure accurate counting loss correction in high-count-rate scenarios.

Main Methods:

• Synchronous resetting of preamplifiers and electronic suspension during reset periods.
• Correction for the dead time of the incoming count rate, addressing its non-linearity.
• Development and testing of a 19-element solid-state detector system.

Main Results:

• An effective method for live-time evaluation and counting loss correction was established.
• A 19-element solid-state detector system capable of high count rates (up to 3.7 x 10^5 counts s^-1 channel^-1) was realized.
• The detector system achieved a resolution of <270 eV FWHM for Mn Kalpha, with dead time independent of photon energy.

Conclusions:

• Synchronous resetting and dead-time correction are vital for accurate fluorescent XAFS data.
• The developed solid-state detector system demonstrates robust performance and reliability for high-count-rate XAFS applications.
• The independence of dead time from photon energy simplifies data analysis and enhances measurement accuracy.