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Updated: Aug 23, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

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Development of 32-channel silicon drift detectors and digital electronics for X-ray spectroscopy

C Gauthier1, G Goujon, J Goulon

  • 1European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble CEDEX, France.

Journal of Synchrotron Radiation
|July 21, 2004
PubMed

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