Absolute soft X-ray measurements using an ion chamber

Area of Science:

• Atomic and Molecular Physics
• Synchrotron Radiation Science
• X-ray Optics

Background:

• Accurate measurement of soft X-ray absolute intensities is critical for various scientific and technological applications.
• Existing methods may have limitations in precision or energy range.
• Synchrotron radiation offers a tunable and intense source for such measurements.

Purpose of the Study:

• To precisely measure soft X-ray absolute intensities.
• To establish a reliable method for quantifying photon flux in the soft X-ray range.
• To provide essential data for researchers utilizing soft X-rays.

Main Methods:

• Utilized a cylindrical double ion chamber (1.3 m length) for ion collection.
• Employed monochromated synchrotron radiation as the soft X-ray source.
• Applied the gamma-value (average electrons per absorbed photon) for rare gases to determine absolute photon intensity.

Main Results:

• Absolute soft X-ray intensities were measured in the range of 1 to 25 Gphotons s⁻¹.
• Measurements covered the photon energy range of 72 to 800 eV.
• Estimated uncertainty in the measurements was between 5% and 20%.

Conclusions:

• The developed method enables accurate determination of soft X-ray absolute intensities.
• The obtained data are valuable for calibration and application development in soft X-ray science.
• The technique demonstrates good performance across a significant soft X-ray energy spectrum.