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Investigation of the phase shift in X-ray forward diffraction using an X-ray interferometer
1Institute of Materials Structure Science, High Energy Accelerator Research Organization, 1-1 Oho, Tsukuba, Ibaraki 305, Japan.
Journal of Synchrotron Radiation
|July 21, 2004
Summary
This study explores X-ray diffraction phase shifts in perfect silicon crystals using dynamical theory and a triple Laue-case interferometer. The research investigates the phase shift of forward-diffracted X-rays in Bragg geometry.
Area of Science:
- Solid-state physics
- Crystallography
- Optics
Background:
- Dynamical theory of X-ray diffraction explains wave propagation in crystals.
- Understanding phase shifts is crucial for X-ray interferometry and imaging.
Purpose of the Study:
- To investigate the phase shift of forward-diffracted X-rays.
- To analyze these shifts in a silicon crystal using Bragg geometry.
- To validate theoretical predictions with experimental data.
Main Methods:
- Utilized dynamical theory of X-ray diffraction.
- Employed a triple Laue-case X-ray interferometer.
- Conducted experiments on a perfect silicon crystal in Bragg geometry.
Main Results:
- Experimental data was collected on the phase shift of forward-diffracted X-rays.
- The behavior of X-rays in a silicon crystal under Bragg diffraction was analyzed.
- The study provides insights into the phase shift phenomena.
Conclusions:
- The phase shift of forward-diffracted X-rays by perfect crystals can be accurately investigated.
- Triple Laue-case interferometry is a viable method for studying X-ray phase shifts.
- Results contribute to the understanding of X-ray-crystal interactions.
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