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Updated: Aug 23, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

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Probing of individual semiconductor nanowhiskers by TEM-STM

Magnus W Larsson1, L Reine Wallenberg, Ann I Persson

  • 1Department of Materials Chemistry, The Nanometer Structure Consortium, Lund University, SE-221 00 Lund, Sweden.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|August 13, 2004
PubMed

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