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An X-ray BBB Michelson interferometer.

John P Sutter1, Tetsuya Ishikawa, Ulrich Kuetgens

  • 1SPring-8/JASRI, 1-1-1 Kouto, Mikazuki-cho, Sayo-gun, Hyogo 679-5198, Japan. sutter@spring8.or.jp

Journal of Synchrotron Radiation
|August 18, 2004
PubMed
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This study details a new X-ray Michelson interferometer, crucial for precise measurements. Experiments confirm its sensitivity to minute path-length changes, highlighting the need for stable operating conditions for advanced X-ray interferometry.

Area of Science:

  • Physics
  • Optics
  • X-ray instrumentation

Background:

  • A novel X-ray Michelson interferometer, building upon the Bonse-Hart BBB interferometer, was previously introduced.
  • This instrument is specifically designed for X-ray wavelengths around 1 Angstrom.

Purpose of the Study:

  • To report on further testing of the X-ray Michelson interferometer at the SPring-8 synchrotron facility.
  • To analyze the interferometer's response to controlled path-length variations.

Main Methods:

  • Utilized a piezo actuator to displace one mirror of the BBB interferometer, inducing path-length differences.
  • Measured intensity variations using an avalanche photodiode as a function of piezo voltage.
  • Observed interference fringes from a refractive wedge during piezo voltage ramping.

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Main Results:

  • Intensity variations correlated with phase shifts due to path-length changes, with a minor contribution from mirror lattice plane shifts.
  • Observed fringe movement confirmed the 'Michelson fringe' interpretation of the results.
  • Determined that a front-mirror displacement of only 0.675 Angstroms is required for a full fringe at the tested wavelength.

Conclusions:

  • The X-ray Michelson interferometer effectively measures minute path-length variations.
  • The device's high sensitivity necessitates a highly stable, quiet environment for optimal operation.
  • Further validation of the interferometer's performance in advanced X-ray applications.