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Measurement of Scattering Nonlinearities from a Single Plasmonic Nanoparticle
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Contrast-to-gradient method for the evaluation of image resolution taking account of random noise in scanning

Tohru Ishitani1, Mitsugu Sato

  • 1Naka Division, Hitachi High-Technologies Corporation, 882 Ichige, Hitachinaka-shi, Ibaraki-ken 312-8504, Japan. ishitani-tohru@naka.hitachi-hitec.com

Journal of Electron Microscopy
|August 31, 2004
PubMed

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