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A Bayesian framework for multilead SMD post-placement quality inspection

Michael E Zervakis1, Stefanos K Goumas, George A Rovithakis

  • 1Department of Electronic and Computer Engineering, Technical University of Crete, 73100 Chania, Greece. michalis@systews.tuc.gr

Summary

This study introduces a new framework for inspecting surface mount device (SMD) placement quality on printed circuit boards (PCBs). The method accurately measures lead displacement using image analysis and geometric relations for enhanced quality control.

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