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Estimating degradation model parameters using neighborhood pattern distributions: an optimization approach

Tapas Kanungo1, Qigong Zheng

  • 1IBM Almanden Research Center, San Jose, CA 95120, USA. kanungo@almaden.ibm.com

Summary

This study introduces a new parameter estimation algorithm for binary image degradation models. The method accurately estimates degradation parameters from degraded images, crucial for image restoration and synthetic data generation.

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