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Scanning-probe Single-electron Capacitance Spectroscopy
Published on: July 30, 2013
Modeling electric-field-sensitive scanning probe measurements for a tip of arbitrary shape
Irma Kuljanishvili1, Subhasish Chakraborty, I J Maasilta
1Department of Physics and Astronomy, Michigan State University, 4237 Biomedical Physical Sciences, East Lansing, MI 48824-2320, USA.
Ultramicroscopy
|November 24, 2004
Abstract:
We present a numerical method to model electric-field-sensitive scanning probe microscopy measurements which allows for a tip of arbitrary shape and invokes image charges to exactly account for a sample dielectric overlayer. The method is applied to calculate the spatial resolution of a subsurface charge accumulation imaging system, achieving reasonable agreement with experiment.
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