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Updated: Aug 20, 2026

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
Published on: March 12, 2017
Separation of linear and non-linear imaging components in high-resolution transmission electron microscope images
Tsunenori Nomaguchi1, Tadahiro Kawasaki, Yoshihide Kimura
1Department of Material and Life Sciences, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan. nomaguchi@atom.mls.eng.osaka-u.ac.jp
Abstract:
Linear and non-linear image components in high-resolution transmission electron microscope images were successfully separated by applying a bandpass filter to the three-dimensional Fourier spectrum of its through-focus series of images. In the observed lattice image of a wedgeshaped Si [110] crystal, we determined the magnitude of the contribution of the non-linear imaging components to the total image intensity distribution. The contribution was proved to become sometimes larger than that of the linear imaging component, even at a thickness of 13 nm.
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