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Updated: Aug 20, 2026

Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy
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Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy

Published on: July 14, 2022

Side-milling technique of preparing device cross-sections for electron holography based on a focused ion beam

Zhouguang Wang, Takeharu Kato, Tsukasa Hirayama

    Journal of Electron Microscopy
    |December 8, 2004
    PubMed

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