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High-speed Continuous-wave Stimulated Brillouin Scattering Spectrometer for Material Analysis
Published on: September 22, 2017
Strehl ratio for focusing into biaxially birefringent media
1Philips Research Laboratories, 5656 AA Eindhoven, The Netherlands. sjoerd.stallinga@philips.com
Abstract:
The Strehl ratio for focusing into biaxially birefringent media with small birefringence is investigated. An analytical expression for the Strehl ratio as a function of the polarization and birefringence parameters is derived in the paraxial limit from a generalization of the scalar aberration theory. The expression agrees well with results of a numerical calculation.

