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Updated: Aug 20, 2026

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
Published on: July 27, 2018
The determination of absolute anion formation cross sections from electron beam scattering data
J-P Ziesel1, N C Jones, D Field
1Laboratoire Collisions, Agrégats, Réactivité (CNRS UMR 5589), Université Paul Sabatier, 31062 Toulouse, France.
Abstract:
Using recent low energy electron scattering data for CCl4 and SF6, and accompanying theory illustrating the coupling of attachment and elastic scattering, absolute cross sections are derived for electron attachment to CCl4 and SF6 between impact energies, respectively, of 8-52 meV and 7-42 meV. Values of attachment cross sections are compared with those obtained by laser and threshold photoionization techniques, which include normalization to rate coefficient data. Excellent agreement with the latest CCl4 data is obtained, with less precise agreement for SF6, but still lying within experimental uncertainties.
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