Qian Tang1, San-Qiang Shi, Limin Zhou
1Department of Mechanical Engineering, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong.
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Atomic Force Microscopy (AFM) is a versatile surface analysis tool. Recent AFM-based nanotechnologies enable precise nanofabrication for applications in nanoelectronics and biosensors.
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