Related Experiment Video

Updated: Aug 2, 2026

Atomically Traceable Nanostructure Fabrication
12:35

Atomically Traceable Nanostructure Fabrication

Published on: July 17, 2015

Strategies for fabricating atom probe specimens with a dual beam FIB

M K Miller1, K F Russell, G B Thompson

  • 1Metals and Ceramics Division, Oak Ridge National Laboratory, P.O. Box 2008, Building 4500S, MS 6136, Oak Ridge, TN 37831-6136, USA. millermk@ornl.gov

Ultramicroscopy
|February 8, 2005
PubMed

More Related Videos

Atom Probe Tomography Analysis of Exsolved Mineral Phases08:14

Atom Probe Tomography Analysis of Exsolved Mineral Phases

Published on: October 25, 2019

Focused Ion Beam Lithography to Etch Nano-architectures into Microelectrodes13:49

Focused Ion Beam Lithography to Etch Nano-architectures into Microelectrodes

Published on: January 19, 2020

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...