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Updated: Aug 19, 2026

Emission Spectroscopic Boundary Layer Investigation during Ablative Material Testing in Plasmatron
Published on: June 9, 2016
[The research to the optimal calibration model for discrete scanning spectrometers]
Yong-jun Lu1, Yan-ling Qu, Jun Zhang
1State Key Laboratory ot Applied Optics, Changchun Institute ot Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130022, China.
Abstract:
For spectrometers which don't operate in consistently scanning mode such as fixed-filter spectrometer, diode arrays spectrometer and so on, how to find an optimal wavelengths combination rapidly and accurately has always been a key problem in NIR so far. The conventional methods to choose the optimal wavelengths for calibration are Forward Stepwise multiple linear Regression (FSR) and Backward Stepwise Regression (BSR), which choose the optimal wavelengths based on the t test result of all the calibration wavelengths. However, maybe the wavelength eliminated is very useful in application and the wavelength chosen may not be so useful as expected, as a result it is compulsory to make more tests to verify the truly applicable wavelength combination for calibration. In this paper the combination of the combination-making algorithm in combinatorics and computer languages which operate facing matrix is used to choose the optimal combination of wavelengths for calibration automatically and efficiently by computer. The most robust calibration equation can be obtained by making analysis of calibration regression that operates to find the minimum root mean standard error of calibration.
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