A multi-wall carbon nanotube (MWCNT) relocation technique for atomic force microscopy (AFM) samples

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Functionalization of Single-walled Carbon Nanotubes with Thermo-reversible Block Copolymers and Characterization by Small-angle Neutron Scattering
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Functionalization of Single-walled Carbon Nanotubes with Thermo-reversible Block Copolymers and Characterization by Small-angle Neutron Scattering

Published on: June 1, 2016

Yongzhi Cao1, Yingchun Liang, Shen Dong

  • 1Precision Engineering Research Institute, Harbin Institute of Technology 413, Harbin, Heilongjiang 150001, China. caoyongzhi1@yahoo.com.cn

Ultramicroscopy
|March 19, 2005
PubMed

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...